Description: VLSI Test Principles and Architectures: Design for Testability (The Morga - GOOD Product Id:0123705975 Condition:USED_GOOD Notes:Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc...
Price: 57.79 USD
Location: Montgomery, Illinois
End Time: 2024-11-09T23:09:41.000Z
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Item must be returned within: 30 Days
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Brand: Unbranded
Book Title: VLSI Test Principles and Architectures: Design for Testability (
MPN: Does not apply
Number of Pages: 808 Pages
Publication Name: Vlsi Test Principles and Architectures : Design for Testability
Language: English
Publisher: Elsevier Science & Technology
Publication Year: 2006
Subject: Industrial Design / Product, Electronics / Circuits / Integrated, Electronics / Circuits / Vlsi & Ulsi, Technical & Manufacturing Industries & Trades
Type: Textbook
Item Length: 9.2 in
Author: Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
Subject Area: Technology & Engineering
Item Width: 7.5 in
Format: Hardcover
